Facilities
Specialized instruments/Equipments
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- Atomic Force Microscopy (NTEGRA PRIMA, NT-MDT, Russia)
- Scanning Electron Microscope (SEM) (Phenom World Pro)
- TEM (LVEM5, Delong Instruments, Canada)
- FEI Quanta 200 Environmental SEM
- Optical microscopes
- Langmuir film balance
- Dynamic Tensiometers
- Contact angle meter
- Quartz crystal microbalance
- Coating Unit
- Single crystal macromolecular diffractometer
- High Performance Computer Cluster
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